High-quality microcrystalline silicon films with improved stability were prepared by plasma enhanced chemical vapour deposition technique from SiCl4/H2 under 250℃, at a higher rate over 0.28nm/s, with a crystalline fraction of 80%. The photoconductivity of the microcrystalline silicon films keeps a constance after 540min long light soaking. The thickness uniformity of films was markedly improved (more than 95%) by altering the distribution of pore.
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Cite this article as: ZHU Zu-Song, ZHANG Jie, YI Ming-Fang, YIN Xun-Chang, WEN Jun. Preparation of the high-quality and stable [J]. J Sichuan Univ: Nat Sci Ed, 2016, 53: 157.